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For the Inventor, By the Inventor

Fremont, CA, United States of America

Yi-Xiang Wang

USPTO Granted Patents = 13

Average Co-Inventor Count = 3.0

ph-index = 4

Forward Citations = 41(Granted Patents)


Company Filing History:

goldMedal13 out of 160 
 
Hermes Microvision Inc.
 patents

Years Active: 2012-2018

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13 patents (USPTO):
1. 9991147 - Wafer grounding and biasing method, apparatus, and application (2018-06-05),
2. 9536697 - System and method for calibrating charge-regulating module (2017-01-03),
3. 9400176 - Dynamic focus adjustment with optical height detection apparatus in electron beam system (2016-07-26),
4. 9076629 - Particle detection system (2015-07-07),
5. 8908348 - Wafer grounding and biasing method, apparatus, and application (2014-12-09),
6. 8809779 - Method and system for heating substrate in vacuum environment and method and system for identifying defects on substrate (2014-08-19),
7. 8791414 - Dynamic focus adjustment with optical height detection apparatus in electron beam system (2014-07-29),
8. 8698070 - Phase detector (2014-04-15),
9. 8624186 - Movable detector for charged particle beam inspection or review (2014-01-07),
10. 8552377 - Particle detection system (2013-10-08),
11. 8519333 - Charged particle system for reticle/wafer defects inspection and review (2013-08-27),
12. 8294094 - Method and apparatus for reducing substrate edge effect during inspection (2012-10-23),
13. 8237125 - Particle detection system (2012-08-07),

Title: Yi-Xiang Wang: A Leader in Innovative Wafer Technology

Introduction

Yi-Xiang Wang, an esteemed inventor based in Fremont, CA, has significantly contributed to the field of wafer technology, holding an impressive portfolio of 13 patents. His work primarily focuses on advancements in grounding and biasing methods applicable to charged particle beam apparatuses.

Latest Patents

Among his latest patents are the "Wafer grounding and biasing method, apparatus, and application," where he has developed a technique that utilizes a pulse current pin to enhance the performance of wafer substrates. This method allows for effective current flow through the wafer, ensuring improved functionality. Additionally, his patent titled "System and method for calibrating charge-regulating module" introduces a novel system for calibrating charge-regulation modules in vacuum environments, optimizing their accuracy and effectiveness through precise movement controls for beam alignment on sample surfaces.

Career Highlights

Yi-Xiang Wang has made remarkable strides throughout his career, primarily as an inventor at Hermes Microvision Inc. His innovative solutions have not only strengthened the company’s position in the technology market but have also propelled advancements in semiconductor manufacturing techniques. His expertise in wafer technology has established him as a key figure within his organization.

Collaborations

Wang has collaborated with talented colleagues like Joe Wang and Zhongwei Chen, contributing to a dynamic work environment that fosters creativity and innovation. Together, they have worked on various projects that push the boundaries of what is possible in wafer technology.

Conclusion

Yi-Xiang Wang’s contributions to the realm of wafer technology and his continuous pursuit of innovation reflect his dedication to improving industrial processes. As a testament to his expertise, his patents serve as a valuable resource for those seeking to understand advancements in this specialized field. His work at Hermes Microvision Inc. ensures that he remains at the forefront of technological development in the semiconductor industry.

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