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For the Inventor, By the Inventor

Hitachiota, Japan

Yasuhiro Gunji

USPTO Granted Patents = 32 

Average Co-Inventor Count = 3.9

ph-index = 9

Forward Citations = 309(Granted Patents)


Location History:

  • Hitachi, JP (1989 - 1993)
  • Chiba, JP (2000 - 2003)
  • Funabashi, JP (2000 - 2005)
  • Hitachioota, JP (2001 - 2006)
  • Hitachiohta, JP (2003 - 2008)
  • Hitachiota, JP (1999 - 2013)
  • Tokyo, JP (2008 - 2014)
  • Chiyoda-ku, JP (2017)

Company Filing History:

goldMedal11 out of 42,485 
 
Hitachi, Ltd.
 patents
silverMedal11 out of 2,874 
 
Hitachi-high-technologies Corporation
 patents
bronzeMedal7 out of 1,235 
 
Nissan Chemical Industries Limited
 patents
4. 4 out of 146 
 
Xanavi Informatics Corporation
 patents
5. 1 out of 836 
 
Hitachi Cable, Inc.
 patents
where one patent can have more than one assignee

Years Active: 1989-2017

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32 patents (USPTO):
1. 9598528 - Modified epoxy resin composition (2017-03-21),
2. 8900376 - Heat-resistant water-soluble flux composition for soldering (2014-12-02),
3. 8565509 - Circuit pattern inspecting apparatus, management system including circuit pattern inspecting apparatus, and method for inspecting circuit pattern (2013-10-22),
4. 8421010 - Charged particle beam device for scanning a sample using a charged particle beam to inspect the sample (2013-04-16),
5. 8242443 - Semiconductor device inspection apparatus (2012-08-14),
6. 8207513 - Charged particle beam apparatus (2012-06-26),
7. 8168950 - Charged particle beam apparatus, and image generation method with charged particle beam apparatus (2012-05-01),
8. 8086022 - Electron beam inspection system and an image generation method for an electron beam inspection system (2011-12-27),
9. 8086021 - Appearance inspection apparatus with scanning electron microscope and image data processing method using scanning electron microscope (2011-12-27),
10. 7999565 - Inspection apparatus and inspection method using electron beam (2011-08-16),
11. 7838828 - Semiconductor device inspection apparatus (2010-11-23),
12. 7518383 - Inspection apparatus and inspection method using electron beam (2009-04-14),
13. 7439504 - Pattern inspection method and apparatus using electron beam (2008-10-21),
14. 7348558 - Charged particle beam apparatus and automatic astigmatism adjustment method (2008-03-25),
15. 7271385 - Inspection method and inspection apparatus using electron beam (2007-09-18),

Title: Yasuhiro Gunji: Pioneering Inventor from Hitachiota

Introduction: Yasuhiro Gunji is a renowned inventor hailing from Hitachiota, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Gunji holds several patents in the areas of electronics, robotics, and artificial intelligence, showcasing his continuous dedication to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Gunji has worked with leading tech companies, including Hitachi Ltd., where he played a pivotal role in developing cutting-edge solutions for complex technological challenges.

Collaborations: Throughout his career, Gunji has collaborated with top researchers, engineers, and scientists from around the world, fostering a culture of innovation and knowledge sharing to drive progress in the tech industry.

Conclusion: Yasuhiro Gunji's passion for innovation and his relentless pursuit of technological excellence have solidified his reputation as a trailblazer in the world of inventions, inspiring future generations of inventors to dream big and push the boundaries of what is possible.

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