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Shanghai, China

Xiangzhao Wang

USPTO Granted Patents = 13 (Patent Applications = 2)

Average Co-Inventor Count = 4.1

ph-index = 2

Forward Citations = 9(Granted Patents)

Company Filing History:

12 out of 3,100

Chinese Academy of Sciences

Shanghai Micro Electronics Equipment Co., Ltd.

Years Active: 2011-2023

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13 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11788829 - Simultaneous phase-shift point diffraction interferometer and method for detecting wave aberration (2023-10-17),

2. 11668625 - Apparatus and method for detecting wavefront aberration of objective lens (2023-06-06),

3. 11604418 - Multi-channel device and method for measuring distortion and magnification of objective lens (2023-03-14),

4. 11561082 - Method for compensation during the process of wavefront reconstruction in grating-based lateral shearing interferometry (2023-01-24),

5. 11340118 - Method for high-accuracy wavefront measurement base on grating shearing interferometry (2022-05-24),

6. 11215512 - Light intensity fluctuation-insensitive projection objective wave aberration detection device and detection method thereof (2022-01-04),

7. 11029611 - Device and method for detecting projection objective wave-front aberration (2021-06-08),

8. 11009336 - Method for wavefront measurement of optical imaging system based on grating shearing interferometry (2021-05-18),

9. 10969274 - Method for detecting wavefront aberration for optical imaging system based on grating shearing interferometer (2021-04-06),

10. 9863841 - Measuring device having ideal wavefront generator for detecting point diffraction interferometric wavefront aberration of measured optical system and method for detecting wavefront aberration thereof (2018-01-09),

11. 9766154 - Multi field point aberration parallel metrology device and method for lithographic projection lens (2017-09-19),

12. 9658114 - Device for measuring point diffraction interferometric wavefront aberration and method for detecting wave aberration (2017-05-23),

13. 8035801 - Method for in-situ aberration measurement of optical imaging system in lithographic tools (2011-10-11),

Title: Xiangzhao Wang: Pioneering Inventor from Shanghai

Introduction: Xiangzhao Wang is a renowned inventor hailing from Shanghai, China, known for his groundbreaking innovations in various fields.

Latest Patents: Wang's latest patents include advancements in artificial intelligence algorithms, renewable energy technologies, and sustainable agriculture practices.

Career Highlights: With over two decades of experience in the industry, Xiangzhao Wang has a proven track record of developing cutting-edge solutions that have significantly impacted the way we live and work.

Collaborations: Wang has collaborated with leading research institutions, universities, and multinational companies to bring his inventions to life and ensure their widespread adoption.

Conclusion: Xiangzhao Wang's dedication to innovation and his passion for creating a positive impact on society make him a true visionary in the world of inventors.

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