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For the Inventor, By the Inventor

Richardson, TX, United States of America

Wah Kit Loh

USPTO Granted Patents = 44 

Average Co-Inventor Count = 2.3

ph-index = 10

Forward Citations = 277(Granted Patents)


Location History:

  • Houston, TX (US) (1993)
  • Richardson, TX (US) (1992 - 2022)

Company Filing History:

goldMedal44 out of 29,232 
 
Texas Instruments Corporation
 patents
silverMedal1 out of 42,485 
 
Hitachi, Ltd.
 patents
where one patent can have more than one assignee

Years Active: 1992-2022

where 'Filed Patents' based on already Granted Patents

44 patents (USPTO):
1. 11355182 - Array power supply-based screening of static random access memory cells for bias temperature instability (2022-06-07),
2. 9805788 - Array power supply-based screening of static random access memory cells for bias temperature instability (2017-10-31),
3. 9576643 - Array power supply-based screening of static random access memory cells for bias temperature instability (2017-02-21),
4. 9576621 - Read-current and word line delay path tracking for sense amplifier enable timing (2017-02-21),
5. 9472268 - SRAM with buffered-read bit cells and its testing (2016-10-18),
6. 9466356 - Array power supply-based screening of static random access memory cells for bias temperature instability (2016-10-11),
7. 9455021 - Array power supply-based screening of static random access memory cells for bias temperature instability (2016-09-27),
8. 9412437 - SRAM with buffered-read bit cells and its testing (2016-08-09),
9. 9208902 - Bitline leakage detection in memories (2015-12-08),
10. 9208899 - Universal test structures based SRAM on-chip parametric test module and methods of operating and testing (2015-12-08),
11. 9208832 - Functional screening of static random access memories using an array bias voltage (2015-12-08),
12. 9093315 - CMOS process to improve SRAM yield (2015-07-28),
13. 8971138 - Method of screening static random access memory cells for positive bias temperature instability (2015-03-03),
14. 8755237 - SRAM power reduction through selective programming (2014-06-17),
15. 8716808 - Static random-access memory cell array with deep well regions (2014-05-06),

Title: **Wah Kit Loh: Innovator in Semiconductor Technology**

Introduction

Wah Kit Loh, based in Richardson, TX, is a distinguished inventor known for his significant contributions to semiconductor technology, with an impressive portfolio of 44 patents. His innovative work has impacted the design and functionality of complementary metal-oxide-semiconductor (CMOS) integrated circuits.

Latest Patents

Among his latest patents is the invention titled "Array power supply-based screening of static random access memory cells for bias temperature instability." This method focuses on screening CMOS integrated circuits, including SRAM cells, to identify transistors that are susceptible to shifts in their characteristics over time. By applying separate ground or power supply voltage levels to the source nodes of transistors, Loh's method aims to mimic the effects of bias temperature instability (BTI). This innovative approach allows for the identification of cells vulnerable to threshold voltage shifts, thus enhancing the reliability of electronic devices.

Career Highlights

Wah Kit Loh has worked with renowned companies such as Texas Instruments Corporation and Hitachi, Ltd., where he has leveraged his expertise in semiconductor design and innovation. His contributions in these roles have helped to advance the field of integrated circuit technology.

Collaborations

Throughout his career, Loh has collaborated with talented individuals, including Xiaowei Deng and Anand Seshadri. These collaborations have fostered an environment of innovation, leading to the development of advanced technologies in the semiconductor industry.

Conclusion

Wah Kit Loh's extensive experience and innovative spirit make him a key figure in the field of semiconductor technology. With his 44 patents and ongoing contributions, Loh continues to push the boundaries of what is possible in integrated circuit design, ensuring improvements in the performance and reliability of modern electronics.

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