Company Filing History:

8 out of 13,684

Applied Materials, Inc.

patents

1 out of 533

Applied Materials Israel Limited

patents

Years Active: 2010-2014

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9 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8924904 - Method and apparatus for determining factors for design consideration in yield analysis (2014-12-30),

2. 8799831 - Inline defect analysis for sampling and SPC (2014-08-05),

3. 8049521 - Solar parametric testing module and processes (2011-11-01),

4. 7962864 - Stage yield prediction (2011-06-14),

5. 7956337 - Scribe process monitoring methodology (2011-06-07),

6. 7937179 - Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects (2011-05-03),

7. 7844101 - System and method for performing post-plating morphological Cu grain boundary analysis (2010-11-30),

8. 7760929 - Grouping systematic defects with feedback from electrical inspection (2010-07-20),

9. 7760347 - Design-based method for grouping systematic defects in lithography pattern writing system (2010-07-20),

Title: Vicky Svidenko: Innovator in Semiconductor Yield Analysis

Introduction

Vicky Svidenko is a prominent inventor based in Sunnyvale, California, known for her significant contributions to the field of semiconductor fabrication. With a total of nine patents to her name, she has made remarkable advancements in yield analysis methodologies.

Latest Patents

Among her latest patents is a method and apparatus for determining factors for design consideration in yield analysis. This invention provides a computer-implemented method that includes obtaining geometric characteristics of defects on a chip and design data associated with those defects. The method determines a criticality factor of the defect based on the geometric characteristics and design data, ultimately outputting the criticality factor. Another notable patent is the inline defect analysis for sampling and Statistical Process Control (SPC). This method involves receiving geometric characteristics of individual defects and design data, determining which defects are likely to be nuisance defects, and refraining from sampling those defects.

Career Highlights

Vicky has worked with leading companies in the semiconductor industry, including Applied Materials, Inc. and Applied Materials Israel Limited. Her experience in these organizations has allowed her to develop innovative solutions that enhance the efficiency and effectiveness of semiconductor manufacturing processes.

Collaborations

Throughout her career, Vicky has collaborated with talented professionals, including Youval Nehmadi and Rinat Shimshi. These collaborations have contributed to her success and the advancement of her inventions.

Conclusion

Vicky Svidenko's work in semiconductor yield analysis showcases her innovative spirit and dedication to improving manufacturing processes. Her patents reflect her expertise and commitment to advancing technology in the semiconductor industry.

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