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For the Inventor, By the Inventor

Taipei, Taiwan

Tung-Tso Tsai

This inventor holds 28 USPTO granted patents and 9 published patent applications, primarily in Image Processing. Top assignee: Hon Hai Precision Industry Co., Ltd.. Active years: 2018-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tung-Tso Tsai. Retrieved from https://idiyas.com/inventor/tung-tso-tsai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 28 

% Patents Active = 100.0

Average Co-Inventor Count = 4.1

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:

goldMedal28 out of 19,792 
 
Hon Hai Precision Industry Co., Ltd.
 patents

Years Active: 2018-2025

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Areas of Expertise:
Image Processing
Defect Detection
Deep Learning
Model Optimization
Tumor Detection
Gesture Recognition
Image Analysis
Error Reduction
Data Model
Magnetic Scanning
Multi-Scale Images
Electronic Devices
28 patents (USPTO):Explore Patents
1. 12475374 - Image processing method, electronic device and storage medium (2025-11-18),
2. 12373928 - Image correction method and computing device utilizing method (2025-07-29),
3. 12367429 - Method and device for optimizing deep learning model conversion, and storage medium (2025-07-22),
4. 12260537 - Defect detection method, computer device and storage medium (2025-03-25),
5. 12260535 - Method for detecting defects in images, computer device, and storage medium (2025-03-25),
6. 12211198 - Method for detecting defects in divided and further divided images based on trained models, electronic device, and storage medium (2025-01-28),
7. 12125193 - Method for detecting defect in products and electronic device using method (2024-10-22),
8. 12118714 - Method of detecting and classifying defects and electronic device using the same (2024-10-15),
9. 12118704 - Model input size determination method, electronic device and storage medium (2024-10-15),
10. 12112527 - Method and device for detecting defects, electronic device using method, and non-transitory storage medium (2024-10-08),
11. 12112522 - Defect detecting method based on dimensionality reduction of data, electronic device, and storage medium (2024-10-08),
12. 12094096 - Method and device for detecting defects, electronic device using method, and non-transitory storage medium (2024-09-17),
13. 12067705 - Method for detecting data defects and computing device utilizing method (2024-08-20),
14. 12039710 - Method for improving efficiency of defect detection in images, image defect detection apparatus, and computer readable storage medium employing method (2024-07-16),
15. 12039015 - Method for detecting defects in multi-scale images and computing device utilizing method (2024-07-16),

Title: The Innovative Journey of Tung-Tso Tsai

Introduction: Tung-Tso Tsai, a pioneering inventor hailing from New Taipei, Taiwan, has made significant contributions to the field of technology with his groundbreaking inventions and patents.

Latest Patents: Tung-Tso Tsai holds several patents in the areas of electronics and telecommunications, with his most recent patent focusing on advanced semiconductor technology for mobile devices.

Career Highlights: Throughout his illustrious career, Tung-Tso Tsai has worked with leading tech companies to develop cutting-edge solutions, earning a reputation for his innovative approach and problem-solving skills.

Collaborations: Tung-Tso Tsai has collaborated with top researchers and engineers in the industry, fostering a culture of innovation and excellence in all his projects. His collaborative efforts have led to the successful development of revolutionary products.

Conclusion: Tung-Tso Tsai's relentless pursuit of innovation and his passion for pushing the boundaries of technology have established him as a prominent figure in the world of inventors. His work continues to inspire future generations of innovators to think outside the box and create solutions that shape the future.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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