The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Jan. 26, 2022
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method of detecting defects revealed in images of products obtains sample image training data. An underlying feature dimension of an autoencoder is selected and a score is obtained. By comparing the score with a standard score, an optimal underlying feature dimension is confirmed. A test image is inputted into the autoencoder with the optimal underlying feature dimension to obtain a reconstruction image. A reconstruction error between the test image and the reconstruction image is computed. By comparing the reconstruction error with the predefined threshold a result of analysis of the test image is outputted. An image defect detection apparatus and a computer readable storage medium applying the method are also provided.