The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2024
Filed:
Dec. 15, 2021
Applicant:
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Inventors:
Assignee:
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 3/08 (2023.01); G06V 10/40 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06N 3/08 (2013.01); G06V 10/40 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract
A method for detecting data defects and a computing device applying the method obtains a test image for analysis. A field to which the test image relates is determined. Based on the field, a target convolutional layer is determined from a convolutional neural network. The target convolutional layer is used to extract features of the test image. A target score of the test image and a score threshold corresponding to the field are determined. If the target score is less than the score threshold, it is determined that the test image reveals defects, thereby improving an accuracy of defect detection.