The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Nov. 15, 2021
Applicant:

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Chin-Pin Kuo, New Taipei, TW;

Shih-Chao Chien, New Taipei, TW;

Tung-Tso Tsai, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 9/00 (2006.01); G06T 7/00 (2017.01); G06T 7/143 (2017.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 7/143 (2017.01); G06T 9/00 (2013.01); G06V 10/751 (2022.01); G06T 2207/30108 (2013.01);
Abstract

A model input size determination method, an electronic device and a storage medium are provided, the method includes acquiring a plurality of test images and a defect result; and encoding each test image to obtain an encoding vector. The encoding vector is decoded to obtain a reconstructed image, then a reconstruction error and a plurality of sub-vectors are calculated; the plurality of sub-vectors is inputted into a Gaussian mixture model, then a plurality of sub-probabilities, an estimated probability and a test error are determined; a detection result in the test image according to the test error and the corresponding error threshold are obtained; an accuracy according to the detection result and the defect result are determined, and an input size is selected from the plurality of preset sizes according to the accuracy. An accuracy of defect detection in manufacturing can be improved.


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