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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12125193 B1

PDFFull Text
Date of Patent:
Oct. 22, 2024

Filed:

Jan. 11, 2022

Method for detecting defect in products and electronic device using method

Applicant:

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

I-Hua Chen, New Taipei, TW;

Tung-Tso Tsai, New Taipei, TW;

Chin-Pin Kuo, New Taipei, TW;

Tzu-Chen Lin, New Taipei, TW;

Assignee:

HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;

Attorney:

ScienBiziP, P.C.

Primary Examiner:

Jiangeng Sun

Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 18/214 (2023.01); G06F 18/22 (2023.01); G06V 10/40 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06F 18/214 (2023.01); G06F 18/22 (2023.01); G06V 10/40 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30108 (2013.01);
Abstract

A method of detecting defects revealed in images of finished products includes importing flawless images into an autoencoder for model training and obtaining reconstructed images from them. The reconstructed images are compared with the flawless images to obtain groups of test errors. An error threshold is selected from the groups of the test errors according to preset rules. In practice, obtaining an image to be tested, and a reconstructed image to be tested, and an error to be tested; determining detection of the image to be tested according to the error and the error threshold; and importing the image into a classifier for defect classification if the image is found to reveal a defect. An electronic device and a non-volatile storage medium for performing the above-described method, are also disclosed.

Find Patent Forward Citations

Chen, I-Hua. (2024). Method for detecting defect in products and electronic device using method (U.S. Patent No. 12125193). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12125193

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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