The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Jul. 22, 2021
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Wan-Jhen Lee, New Taipei, TW;
Tung-Tso Tsai, New Taipei, TW;
Chin-Pin Kuo, New Taipei, TW;
Tzu-Chen Lin, New Taipei, TW;
Guo-Chin Sun, New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A product defect detection method which includes acquiring a detection image of a product to be detected is provided. The method further includes dividing the detection image into a first preset number of detection blocks. Once a detection result of each detection block is obtained by inputting each detection block into a preset defect recognition model, according to a position of each detection block in the detection image, a detection result of the product is determined according to the detection result of each detection block.