Hsinchu, Taiwan

Tsung-Yang Hung

This inventor holds 14 USPTO granted patents and 2 published patent applications, primarily in Integrated Circuit Testing. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2008-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tsung-Yang Hung. Retrieved from https://idiyas.com/inventor/tsung-yang-hung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 14 

% Patents Active = 71.4

Average Co-Inventor Count = 2.7

ph-index = 4

Forward Citations = 79(Granted Patents)


Location History:

  • Jhubei, TW (2008 - 2012)
  • Zhubei, TW (2012)
  • Hsinchu County, TW (2021 - 2024)

Company Filing History:


Years Active: 2008-2026

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Areas of Expertise:
Circuit Screening
Defect Detection
Integrated Circuit Testing
Wafer-Level Testing
Failure Analysis
ESD Network
Phase Lock Loop
Wireless Communication
Mass Die Testing
Modeling Defects
14 patents (USPTO):Explore Patents

Title: The Innovations of Inventor Tsung-Yang Hung

Introduction: Tsung-Yang Hung, an accomplished inventor based in Hsinchu County, Taiwan, has made significant contributions to the field of electronics and integrated circuit testing. With a remarkable record of 12 patents, he is known for his innovative methods that enhance the reliability and performance of logic devices.

Latest Patents: Among his notable inventions is a patent for a "Method and Apparatus for Detecting Defective Logic Devices." This invention outlines an apparatus designed for testing devices under a specific set of conditions. The apparatus employs a power supply that provides two different voltages at distinct time intervals, ensuring effective testing of the device under test (DUT). Another significant patent is for a "Method and System for Testing an Integrated Circuit." This method involves testing multiple scan chains across various cycles to identify flaws, thereby enhancing the efficiency of fault detection in integrated circuits.

Career Highlights: Tsung-Yang Hung has spent considerable time at Taiwan Semiconductor Manufacturing Company Limited, where he has played a crucial role in developing innovative solutions for integrated circuit testing. His expertise has led to advancements that significantly improve testing processes and device performance.

Collaborations: Throughout his career, Tsung-Yang Hung has worked alongside talented colleagues, including Chi-Che Wu and Ming-Yih Wang. These collaborations have fostered an environment of innovation and creativity, allowing for the development of groundbreaking technologies in the semiconductor industry.

Conclusion: Tsung-Yang Hung stands out as a remarkable inventor, whose work continues to influence the field of electronics. His numerous patents reflect a commitment to innovation, advancing the testing methodologies that are essential for modern integrated circuits. As technology progresses, the impact of his inventions will undoubtedly resonate throughout the industry for years to come.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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