Hino, Japan

Tsukasa Nakai

This inventor holds 44 USPTO granted patents and 4 published patent applications, primarily in Semiconductor Memory. Top assignees: Kabushiki Kaisha Toshiba, Toshiba Memory Corporation. Active years: 2006-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tsukasa Nakai. Retrieved from https://idiyas.com/inventor/tsukasa-nakai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 44 

% Patents Active = 40.9

Average Co-Inventor Count = 4.8

ph-index = 7

Forward Citations = 187(Granted Patents)


Location History:

  • Tokyo, JP (2012 - 2014)
  • Hino, JP (2006 - 2015)
  • Mie-ken, JP (2015)
  • Yokkaichi Mie, JP (2016)
  • Yokkaichi, JP (2016 - 2017)
  • Mie, JP (2017 - 2020)
  • Hino Tokyo, JP (2021)

Company Filing History:


Years Active: 2006-2021

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Areas of Expertise:
Semiconductor Measurement
Scanning Probe Microscopy
Non-Volatile Memory
Integrated Circuit
Magnetoresistive Element
Information Recording
Optical Recording
Phase Change Memory
Sputtering Target
Storage Medium
Recording Method
Reproducing Method
44 patents (USPTO):Explore Patents

Title: **Innovative Contributions of Tsukasa Nakai in Semiconductor Technology**

Introduction

Tsukasa Nakai, located in Hino, Japan, is a distinguished inventor with an impressive portfolio of 44 patents. His work primarily focuses on advancements in semiconductor technology, showcasing his expertise and innovative approach in the field.

Latest Patents

Among Tsukasa Nakai's most recent patents are groundbreaking inventions in semiconductor measurement devices and methods. One notable patent involves a semiconductor measurement device that includes an electrode provided in a semiconductor sample. This device incorporates a probe that contacts the semiconductor sample, where a driver moves the probe's contact position. The invention features a power supply that applies electric power between the probe and the electrode, allowing a measurement operation portion to measure the current flowing through the semiconductor sample. This measurement is conducted as the voltage between the probe and the electrode is varied, creating a comprehensive relationship displayed between voltage and current at various measurement points on the semiconductor surface.

Additionally, Nakai has developed a measuring method for scanning probe microscopy that enhances precision. This method involves moving the probe while maintaining contact with the object being measured. The technique applies a reduced pressing force to ensure accurate measurements of the object's physical properties after reaching a specified depth from its surface.

Career Highlights

Tsukasa Nakai's career includes significant contributions during his tenure at notable companies such as Kabushiki Kaisha Toshiba and Toshiba Memory Corporation. His work at these institutions has played a crucial role in developing innovative technologies that advance semiconductor measurement techniques.

Collaborations

Throughout his career, Nakai has collaborated with esteemed colleagues, including Takayuki Tsukamoto and Sumio Ashida. Their combined expertise has undoubtedly contributed to the success of Nakai's numerous innovations in semiconductor technology.

Conclusion

With his extensive experience and a remarkable number of patents, Tsukasa Nakai continues to make impactful strides in the semiconductor field. His latest inventions not only showcase his ingenuity but also pave the way for future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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