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Toshihiro Furuya

USPTO Granted Patents = 13

Average Co-Inventor Count = 3.2

ph-index = 6

Forward Citations = 177(Granted Patents)

Location History:

Katsuta, JA (1977)
Katsuta, JP (1983 - 1991)

Company Filing History:

13 out of 42,517

Years Active: 1977-1991

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13 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 5001344 - Scanning electron microscope and method of processing the same (1991-03-19),

2. 4912328 - Apparatus for improving the signal-to-noise ratio of image signals in a (1990-03-27),

3. 4912313 - Method of measuring surface topography by using scanning electron (1990-03-27),

4. 4907287 - Image correction system for scanning electron microscope (1990-03-06),

5. 4835385 - Method of measuring sectional shape and a system therefor (1989-05-30),

6. 4817178 - Linear cursor representation method (1989-03-28),

7. 4803358 - Scanning electron microscope (1989-02-07),

8. 4791294 - Electron beam scanning method and scanning electron microscope (1988-12-13),

9. 4755047 - Photometric stereoscopic shape measuring method (1988-07-05),

10. 4733074 - Sample surface structure measuring method (1988-03-22),

11. 4725730 - System of automatically measuring sectional shape (1988-02-16),

12. 4385317 - Specimen image display apparatus (1983-05-24),

13. 4004149 - Apparatus for displaying image produced by electrically charged particle (1977-01-18),

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