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For the Inventor, By the Inventor

Katsuta, Japan

Toshihiro Furuya

This inventor holds 13 USPTO granted patents. Top assignee: Hitachi, Ltd.. Active years: 1977-1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshihiro Furuya. Retrieved from https://idiyas.com/inventor/toshihiro-furuya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 13

% Patents Active = 100.0

Average Co-Inventor Count = 3.2

ph-index = 6

Forward Citations = 178(Granted Patents)


Location History:

  • Katsuta, JA (1977)
  • Katsuta, JP (1983 - 1991)

Company Filing History:

goldMedal13 out of 42,731 
 
Hitachi, Ltd.
 patents

Years Active: 1977-1991

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13 patents (USPTO):Explore Patents
1. 5001344 - Scanning electron microscope and method of processing the same (1991-03-19),
2. 4912328 - Apparatus for improving the signal-to-noise ratio of image signals in a (1990-03-27),
3. 4912313 - Method of measuring surface topography by using scanning electron (1990-03-27),
4. 4907287 - Image correction system for scanning electron microscope (1990-03-06),
5. 4835385 - Method of measuring sectional shape and a system therefor (1989-05-30),
6. 4817178 - Linear cursor representation method (1989-03-28),
7. 4803358 - Scanning electron microscope (1989-02-07),
8. 4791294 - Electron beam scanning method and scanning electron microscope (1988-12-13),
9. 4755047 - Photometric stereoscopic shape measuring method (1988-07-05),
10. 4733074 - Sample surface structure measuring method (1988-03-22),
11. 4725730 - System of automatically measuring sectional shape (1988-02-16),
12. 4385317 - Specimen image display apparatus (1983-05-24),
13. 4004149 - Apparatus for displaying image produced by electrically charged particle (1977-01-18),

Title: Toshihiro Furuya: Innovator in Scanning Electron Microscopy

Introduction

Toshihiro Furuya is a prominent inventor based in Katsuta, Japan. He has made significant contributions to the field of scanning electron microscopy, holding a total of 13 patents. His work has advanced the capabilities of electron microscopy, enabling more precise measurements of surface topography.

Latest Patents

Furuya's latest patents include innovative methods for processing images generated by scanning electron microscopes. One notable patent describes a technique where an image is divided into multiple rectangular areas, allowing for the measurement of relative height differences with reduced distortion. Another patent outlines a method for measuring surface topography using a scanning electron microscope, which involves detecting secondary electrons and calculating differential coefficients to obtain accurate surface measurements.

Career Highlights

Toshihiro Furuya is associated with Hitachi, Ltd., a leading company in technology and innovation. His work at Hitachi has been instrumental in developing advanced imaging techniques that enhance the functionality of scanning electron microscopes. His contributions have been recognized within the industry, showcasing his expertise and commitment to innovation.

Collaborations

Furuya has collaborated with notable colleagues, including Makoto Kato and Tetsuo Yokoyama. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

Toshihiro Furuya's contributions to scanning electron microscopy have significantly impacted the field, demonstrating his innovative spirit and dedication to advancing technology. His patents reflect a commitment to improving measurement techniques, making him a key figure in the realm of scientific innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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