The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 1983
Filed:
Mar. 26, 1980
Applicant:
Inventors:
Toshihiro Furuya, Katsuta, JP;
Osamu Yamada, Katsuta, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ; H04N / ;
U.S. Cl.
CPC ...
358 93 ; 250310 ; 250311 ;
Abstract
A specimen image display apparatus is disclosed in which a specimen signal generated when the surface of a specimen is radiated while being scanned by an electron beam is detected, and this detection signal is used to display a magnified image of the specimen on a cathode ray tube. In addition to the specimen image, a scale of fixed length which remains unchanged regardless of the magnification of the specimen image and a character indicating converted scale are displayed on the cathode-ray tube, thus improving the accuracy of the measurement of the length of the specimen image on the cathode-ray tube.