Yokohama, Japan

Tomoo Motosugi

This inventor holds 7 USPTO granted patents and 2 published patent applications. Top assignee: Nuflare Technology, Inc.. Active years: 2012-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tomoo Motosugi. Retrieved from https://idiyas.com/inventor/tomoo-motosugi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 7 

% Patents Active = 71.4

Average Co-Inventor Count = 1.6

ph-index = 3

Forward Citations = 19(Granted Patents)


Location History:

  • Shizuoka, JP (2012)
  • Kanagawa, JP (2015 - 2017)
  • Yokohama, JP (2017 - 2022)

Company Filing History:


Years Active: 2012-2022

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7 patents (USPTO):Explore Patents

Title: Tomoo Motosugi - Innovator in Charged-Particle Beam Technology

Introduction

Tomoo Motosugi is an inventor based in Yokohama-shi, Japan. He is known for his work in the field of charged-particle beam technology. Although he currently holds no granted patents, his contributions to the field are noteworthy.

Latest Patent Applications

One of his significant patent applications is titled "MULTIPLE CHARGED-PARTICLE BEAM WRITING METHOD AND MULTIPLE CHARGED-PARTICLE BEAM WRITING APPARATUS." This application describes a method that involves emitting multiple charged-particle beams and switching predetermined beams between on and off using a plurality of blankers. The process includes transferring control data for on-off control of each beam to a control circuit, which operates during periods when the writing target substrate is not being irradiated. This innovative approach aims to enhance the precision and efficiency of writing patterns on substrates.

Conclusion

Tomoo Motosugi's work in charged-particle beam technology represents a significant step forward in the field, showcasing his innovative spirit and dedication to advancing technology. His latest patent application highlights the potential for future developments in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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