The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9583310 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 28, 2017

Filed:

Oct. 09, 2015
Applicant:

Nuflare Technology, Inc., Yokohama, JP;

Inventor:

Tomoo Motosugi, Kanagawa, JP;

Assignee:

NuFlare Technology, Inc., Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/00 (2006.01); H01J 37/317 (2006.01); H01J 37/304 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3174 (2013.01); H01J 37/3045 (2013.01); H01J 2237/30433 (2013.01); H01J 2237/30455 (2013.01); H01J 2237/31776 (2013.01); H01J 2237/31796 (2013.01);
Abstract

In a charged particle beam writing apparatus, a charged particle optical system includes a first, second, and third deflection control system configured to form a shot of a charged particle beam, control a shape and size of the shot, and control an irradiation position of the shot respectively. A shot data generation processing device generates shot data of writing a latent image on a resist layer in a sample, using (1) design data of a pattern to be formed in a member, wherein the member is formed in a sample, and the resist layer is formed on the member, and (2) correction information of a shot size and an irradiation shot position obtained from in-plane distribution data of an XY dimension variation amount of dimension measurement patterns. The dimension measurement patterns are formed by writing test patterns on a resist layer and transferring the test patterns onto a member.


Find Patent Forward Citations

Motosugi, Tomoo. (2017). Charged particle beam writing apparatus, charged particle beam writing method, and shot correction method of charged particle beam writing method (U.S. Patent No. 9583310). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9583310

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