Kokubunji, Japan

Tomonori Nakano

This inventor holds 25 USPTO granted patents and 3 published patent applications and 1 EPO patent, primarily in Charged Particle Beam Technology. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation, Fujitsu Component Limited. Active years: 2007-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tomonori Nakano. Retrieved from https://idiyas.com/inventor/tomonori-nakano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 25 

% Patents Active = 64.0


Average Co-Inventor Count = 2.5

ph-index = 5

Forward Citations = 76(Granted Patents)


Location History:

  • Kokubunji, JP (2007 - 2013)
  • Kodaira, JP (2012 - 2014)
  • Tokyo, JP (2015 - 2021)

Company Filing History:


Years Active: 2007-2025

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Areas of Expertise:
Charged Particle Beam
Aberration Corrector
Multipole Lens
Electron Microscope
Chromatic Aberration
Geometrical Aberration
KVM Switch
Measurement Apparatus
Tilted Illumination
Probe Shape Estimation
Radiation Device
Optical Apparatus
25 patents (USPTO):Explore Patents

Title: Innovations of Tomonori Nakano: A Pioneer in Electron Microscopy

Introduction: Tomonori Nakano, based in Kokubunji, Japan, is an esteemed inventor with a commendable portfolio of 24 patents. His innovations primarily focus on advancements in aberration correction and electron microscopy, contributing significantly to the field.

Latest Patents: Among his latest patents, Nakano has developed an aberration corrector and electron microscope designed to provide a broad aberration correction range. This device ensures easy control, highly accurate aberration correction, and reduced costs. It incorporates a first current line group arranged parallel to the optical axis and a second current line group, which independently excites multipole fields of varying orders and intensities. Another notable invention is the multipole lens used within an aberration corrector. This lens enhances stability, allowing for the use of a more economical power source compared to previous designs. This advancement not only lowers the operational costs but also maintains the required precision.

Career Highlights: Tomonori Nakano has made substantial contributions while working at prominent organizations such as Hitachi High-Technologies Corporation and Hitachi High-Tech Corporation. His role in these companies has facilitated the development of cutting-edge technologies in electron microscopy and aberration correction.

Collaborations: Throughout his career, Nakano has collaborated with talented colleagues, including Takeshi Kawasaki and Kotoko Hirose. These partnerships have furthered innovation in their respective fields, emphasizing the importance of teamwork in scientific advancement.

Conclusion: Tomonori Nakano's inventive spirit and dedication to research position him as a significant figure in the technology sector. His patents not only enhance the capabilities of electron microscopes but also pave the way for future innovations in aberration correction techniques, showcasing the vital role of inventors in advancing scientific knowledge and technological progress.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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