This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2012-2015.
Company Filing History:
Years Active: 2012-2015
Title: Innovations of Tamao Ishikawa
Introduction
Tamao Ishikawa is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of semiconductor technology, particularly in defect image processing and classification. With a total of 3 patents, his work has advanced the understanding and management of defects in semiconductor devices.
Latest Patents
Ishikawa's latest patents include a defect image processing apparatus and method, as well as a semiconductor defect classifying apparatus and method. The defect image processing apparatus utilizes normalized cross-correlation to image-match a layout image acquired from design data with an image obtained by removing defect area portions from a defect image. This innovative approach allows for the simultaneous display of both layout and defect images, facilitating easier analysis of systematic defects that may arise due to positional relationships with other layers.
The semiconductor defect classifying method and apparatus efficiently classify defects by accurately determining the overlap state between a design layout pattern and the defect. This process simplifies the identification of systematic defects. The defective image, obtained through inspection or review of a semiconductor device, is automatically pattern-matched with design layout data. The classification process determines whether the defect is within, over, or outside the design pattern, leading to effective defect management.
Career Highlights
Tamao Ishikawa is currently employed at Hitachi High-Technologies Corporation, where he continues to innovate in the semiconductor field. His work has been instrumental in enhancing the efficiency of defect detection and classification, which is crucial for the reliability of semiconductor devices.
Collaborations
Ishikawa has collaborated with notable colleagues, including Yutaka Tandai and Tsunehiro Sakai. Their combined expertise has contributed to the advancement of technologies in defect processing and classification.
Conclusion
Tamao Ishikawa's contributions to semiconductor technology through his innovative patents have significantly impacted the industry. His work in defect image processing and classification continues to pave the way for advancements in semiconductor reliability and efficiency.