Kanagawa, Japan

Takashi Karashima

This inventor holds 5 USPTO granted patents. Top assignee: Renesas Electronics Corporation. Active years: 2013-2026.


% Patents Active = 80.0

Average Co-Inventor Count = 1.8

ph-index = 1

Forward Citations = 3(Granted Patents)


Location History:

  • Kanagawa, JP (2013)
  • Gunma, JP (2017)
  • Tokyo, JP (2021)

Company Filing History:


Years Active: 2013-2026

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5 patents (USPTO):Explore Patents

Title: The Innovations of Takashi Karashima

Introduction

Takashi Karashima is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 5 patents. His work focuses on improving the reliability and functionality of semiconductor devices.

Latest Patents

Karashima's latest patents include a semiconductor device featuring a chip capacitor mounted on a wiring substrate. This invention details a terminal pattern that enhances the connection between the wiring substrate and the capacitor. Another significant patent involves a semiconductor device designed to improve the reliability of imaging functions. This device includes a package with a cavity, a semiconductor chip with an imaging unit, and a translucent cap material that seals the cavity.

Career Highlights

Karashima is currently employed at Renesas Electronics Corporation, where he continues to innovate in semiconductor technology. His work has been instrumental in advancing the capabilities of imaging devices and enhancing their reliability.

Collaborations

Throughout his career, Karashima has collaborated with talented individuals such as Satoshi Yamada and Kenya Hironaga. These collaborations have contributed to the development of cutting-edge technologies in the semiconductor industry.

Conclusion

Takashi Karashima's contributions to semiconductor technology are noteworthy, with several patents that reflect his innovative spirit. His work at Renesas Electronics Corporation continues to push the boundaries of what is possible in the field.

Profile summary based on public USPTO records.
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