Tokyo, Japan

Takao Kinefuchi


Average Co-Inventor Count = 7.7

ph-index = 3

Forward Citations = 62(Granted Patents)


Company Filing History:


Years Active: 2007-2020

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3 patents (USPTO):Explore Patents

Title: Takao Kinefuchi: Innovator in X-ray Inspection Technology

Introduction

Takao Kinefuchi is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of X-ray inspection technology. With a total of 3 patents to his name, Kinefuchi has developed innovative methods and devices that enhance the capabilities of X-ray inspection.

Latest Patents

Kinefuchi's latest patents include an X-ray inspecting device, an X-ray thin film inspecting method, and a method for measuring the rocking curve. The X-ray inspection device features an X-ray irradiation unit that includes a first X-ray optical element for focusing characteristic X-rays in a vertical direction and a second X-ray optical element for focusing the characteristic X-rays in a horizontal direction. The first optical element is made from a crystal material with high crystallinity, while the second element incorporates a multilayer mirror. The X-ray thin film inspection device consists of an X-ray irradiation unit mounted on a first rotation arm and an X-ray detector on a second rotation arm. It also includes a fluorescence X-ray detector that captures fluorescence X-rays generated from the inspection target when irradiated with X-rays.

Career Highlights

Kinefuchi is currently employed at Rigaku Corporation, a leading company in the field of analytical and industrial instrumentation. His work at Rigaku has allowed him to push the boundaries of X-ray technology and contribute to advancements in various applications.

Collaborations

Throughout his career, Kinefuchi has collaborated with notable colleagues, including Hiroshi Motono and Asao Nakano. These collaborations have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

Takao Kinefuchi's innovative work in X-ray inspection technology has made a significant impact in the field. His patents reflect a commitment to advancing the capabilities of X-ray devices, and his contributions continue to influence the industry.

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