Company Filing History:

20 out of 52,711

Kabushiki Kaisha Toshiba

where one patent can have more than one assignee

Years Active: 1994-2016

Loading Chart...

21 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 9368314 - Inspection system by charged particle beam and method of manufacturing devices using the system (2016-06-14),

2. 8803103 - Inspection system by charged particle beam and method of manufacturing devices using the system (2014-08-12),

3. 8368031 - Inspection system by charged particle beam and method of manufacturing devices using the system (2013-02-05),

4. 8053726 - Inspection system by charged particle beam and method of manufacturing devices using the system (2011-11-08),

5. 7973281 - Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus (2011-07-05),

6. 7847250 - Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device (2010-12-07),

7. 7573066 - Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus (2009-08-11),

8. 7569838 - Electron beam inspection system and inspection method and method of manufacturing devices using the system (2009-08-04),

9. 7462829 - Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device (2008-12-09),

10. 7411191 - Inspection system by charged particle beam and method of manufacturing devices using the system (2008-08-12),

11. 7351969 - Electron beam inspection system and inspection method and method of manufacturing devices using the system (2008-04-01),

12. 7302091 - Method and apparatus for determining defect detection sensitivity data, control method of defect detection apparatus, and method and apparatus for detecting defect of semiconductor devices (2007-11-27),

13. 7241993 - Inspection system by charged particle beam and method of manufacturing devices using the system (2007-07-10),

14. 7211796 - Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device (2007-05-01),

15. 6992290 - Electron beam inspection system and inspection method and method of manufacturing devices using the system (2006-01-31),

Title: The Innovative Mind of Takamitsu Nagai

Introduction: Takamitsu Nagai, a pioneering inventor hailing from Kanagawa, Japan, is renowned for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Takamitsu Nagai holds several patents in the realm of robotics and artificial intelligence, showcasing his continuous dedication to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Nagai has worked with prestigious research institutions and leading tech companies, consistently delivering cutting-edge solutions that have revolutionized the industry.

Collaborations: Throughout his career, Takamitsu Nagai has collaborated with top engineers, scientists, and researchers from around the globe, fostering a culture of innovation and knowledge-sharing that has led to remarkable advancements in various technological domains.

Conclusion: Takamitsu Nagai's relentless pursuit of innovation and his unwavering commitment to excellence have solidified his position as a trailblazer in the world of technology, inspiring future generations of inventors to dream big and push the boundaries of what is possible.

This text is generated by artificial intelligence and may not be accurate.

Please report any incorrect information to support@idiyas.com

Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.