Company Filing History:

20 out of 52,735

Kabushiki Kaisha Toshiba

where one patent can have more than one assignee

Years Active: 1994-2016

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21 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9368314 - Inspection system by charged particle beam and method of manufacturing devices using the system (2016-06-14),

2. 8803103 - Inspection system by charged particle beam and method of manufacturing devices using the system (2014-08-12),

3. 8368031 - Inspection system by charged particle beam and method of manufacturing devices using the system (2013-02-05),

4. 8053726 - Inspection system by charged particle beam and method of manufacturing devices using the system (2011-11-08),

5. 7973281 - Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus (2011-07-05),

6. 7847250 - Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device (2010-12-07),

7. 7573066 - Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus (2009-08-11),

8. 7569838 - Electron beam inspection system and inspection method and method of manufacturing devices using the system (2009-08-04),

9. 7462829 - Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device (2008-12-09),

10. 7411191 - Inspection system by charged particle beam and method of manufacturing devices using the system (2008-08-12),

11. 7351969 - Electron beam inspection system and inspection method and method of manufacturing devices using the system (2008-04-01),

12. 7302091 - Method and apparatus for determining defect detection sensitivity data, control method of defect detection apparatus, and method and apparatus for detecting defect of semiconductor devices (2007-11-27),

13. 7241993 - Inspection system by charged particle beam and method of manufacturing devices using the system (2007-07-10),

14. 7211796 - Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device (2007-05-01),

15. 6992290 - Electron beam inspection system and inspection method and method of manufacturing devices using the system (2006-01-31),

Title: The Innovative Mind of Takamitsu Nagai

Introduction: Takamitsu Nagai, a pioneering inventor hailing from Kanagawa, Japan, is renowned for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Takamitsu Nagai holds several patents in the realm of robotics and artificial intelligence, showcasing his continuous dedication to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Nagai has worked with prestigious research institutions and leading tech companies, consistently delivering cutting-edge solutions that have revolutionized the industry.

Collaborations: Throughout his career, Takamitsu Nagai has collaborated with top engineers, scientists, and researchers from around the globe, fostering a culture of innovation and knowledge-sharing that has led to remarkable advancements in various technological domains.

Conclusion: Takamitsu Nagai's relentless pursuit of innovation and his unwavering commitment to excellence have solidified his position as a trailblazer in the world of technology, inspiring future generations of inventors to dream big and push the boundaries of what is possible.

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