Location History:
- Ebina, JP (2014 - 2015)
- Tokyo, JP (2017 - 2024)
Company Filing History:
7 out of 1,125 
6 out of 2,874 
Years Active: 2014-2025
Title: Takahiro Urano: Innovator in Defect Inspection Technology
Introduction
Takahiro Urano is a prominent inventor based in Tokyo, Japan, known for his significant contributions to defect inspection technology. With a total of 13 patents to his name, Urano has developed innovative methods and systems that enhance the precision of defect detection in various applications.
Latest Patents
One of Urano's latest patents is a method for defect inspection, which proposes a novel approach to classifying defects using a suitably trained learning device. This method involves utilizing one or more computers to inspect defects on a sample based on output information from detectors that detect scattered light produced by the sample's irradiation. The process includes receiving output from multiple detectors positioned at various angles and orientations, and inputting this information into a trained learning device to classify defects accurately.
Another notable patent is the defect inspection apparatus and program, which aims to improve defect position precision. This invention allows for easy alignment of coordinate origin offsets between a reviewing apparatus and the defect inspection apparatus, even when design data is unavailable. The apparatus acquires a wafer swath image necessary for inspection and uses it to detect defects while calculating positional deviations. This innovative approach enhances the accuracy of defect detection and correction.
Career Highlights
Urano has worked with notable companies such as Hitachi High-Tech Corporation and Hitachi High-Technologies Corporation. His experience in these organizations has contributed to his expertise in developing advanced defect inspection technologies.
Collaborations
Some of Urano's coworkers include Toshifumi Honda and Takashi Hiroi, who have collaborated with him on various projects related to defect inspection and technology development.
Conclusion
Takahiro Urano's innovative work in defect inspection technology has made a significant impact in the field. His patents reflect a commitment to enhancing precision and efficiency in defect detection, showcasing his role as a leading inventor in this domain.