Ibaraki, Japan

Tadashi Fukumoto


Average Co-Inventor Count = 2.7

ph-index = 4

Forward Citations = 98(Granted Patents)


Location History:

  • Sakai, JP (2002)
  • Ibaraki, JP (2000 - 2009)

Company Filing History:


Years Active: 2000-2009

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6 patents (USPTO):Explore Patents

Title: Innovations by Tadashi Fukumoto

Introduction

Tadashi Fukumoto is a notable inventor based in Ibaraki, Japan. He has made significant contributions to the field of three-dimensional measurement technology. With a total of 6 patents to his name, Fukumoto's work has advanced the capabilities of measuring and inputting three-dimensional shapes.

Latest Patents

Fukumoto's latest patents include a "Method and apparatus for three-dimensional measurement." This innovative method allows for the measurement of a three-dimensional shape of an object's surface using a specialized measuring device. The process involves a posture sensor that detects the device's orientation and a parameter table that stores relevant data for accurate calculations. Another notable patent is the "Three-dimensional shape input device," which utilizes a light projection method to capture the three-dimensional shape of an object. This device features a light projecting portion and an imaging portion, along with a storage section for parameters that enhance the computation of the object's shape.

Career Highlights

Throughout his career, Fukumoto has worked with prominent companies such as Minolta Company, Ltd. and Konica Minolta Sensing, Inc. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking technologies in the field of three-dimensional measurement.

Collaborations

Fukumoto has collaborated with talented individuals such as Akira Yahashi and Makoto Miyazaki. These partnerships have fostered innovation and creativity in his projects.

Conclusion

Tadashi Fukumoto's contributions to three-dimensional measurement technology are noteworthy and impactful. His patents reflect a commitment to advancing the field and improving measurement techniques.

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