The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2009
Filed:
Dec. 21, 2006
Tadashi Fukumoto, Ibaraki, JP;
Koji Morimoto, Hashimoto, JP;
Tadashi Fukumoto, Ibaraki, JP;
Koji Morimoto, Hashimoto, JP;
Konica Minolta Sensing, Inc., Sakai-Shi, JP;
Abstract
A three-dimensional measurement method for conducting measurement of a three-dimensional shape of a surface of an object using a three-dimensional measuring device is provided. The method includes providing, in advance, a posture sensor that detects a posture of the three-dimensional measuring device, providing, in advance, a parameter table in which a parameter corresponding to a posture of the three-dimensional measuring device is stored, and calculating three-dimensional shape data of the object using measurement data and the parameter, the measurement data being obtained by conducting measurement of the object with the three-dimensional measuring device and the parameter being read out from the parameter table according to a posture of the three-dimensional measuring device upon the measurement.