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Konica Minolta Sensing, Inc.

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USPTO Granted Patents = 72

% Expired Patents = 41.7

EPO Patents = 3

Trademarks = 1

Forward Citations = 478

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57 inventors (with patents filed for the assignee):

Kenji Imura (29 out of 43 patents)

Yoshihisa Abe (9 out of 21 patents)

Yoshiroh Nagai (8 out of 25 patents)

4. Kazumi Kitajima (7 out of 7 patents)

5. Shinichi Horita (6 out of 13 patents)

6. Jun Matsumoto (4 out of 170 patents)

7. Masayuki Yamada (4 out of 6 patents)

8. Yoshiyuki Nagashima (4 out of 6 patents)

9. Kazuya Kiyoi (4 out of 5 patents)

10. Toru Kobayashi (4 out of 4 patents)

11. Masao Nakamuro (4 out of 4 patents)

12. Koji Yamamoto (4 out of 35 patents)

13. Katsutoshi Tsurutani (3 out of 16 patents)

14. Shinji Yamamoto (3 out of 17 patents)

15. Norio Ishikawa (3 out of 64 patents)

Core Competencies:

Optical Measurement

Spectral Analysis

Colorimetry

3D Shape Measurement

Vital Information

Biometric Data

Calibration System

Pulse Wave Analysis

Fluorescence Detection

Reflection Characteristics

Light Measuring

Multi-Angle Colorimeter

72 patents: Sort by Forward Citations

1. 8956289 - Vital information measuring device (2015-02-17),

2. 8918298 - Solar cell evaluation device and solar cell evaluation method (2014-12-23),

3. 8801621 - Method, system and program product for analyzing pulse wave data (2014-08-12),

4. 8600468 - Biometric information measuring apparatus and biometric information measuring system (2013-12-03),

5. 8502980 - Spectral characteristic measuring system, spectral characteristic measuring instrument, and data processing device (2013-08-06),

6. 8441470 - Color sensor unit for use in display device, color measuring device for use in display device, display system incorporated with color sensor unit, and display calibration method (2013-05-14),

7. 8436320 - Fluorescence detecting apparatus, and fluorescence detecting method (2013-05-07),

8. 8390803 - Calibration device and optical characteristic measuring system using the same (2013-03-05),

9. 8373722 - Color measuring apparatus and method and liquid crystal display system (2013-02-12),

10. 8345230 - Illumination apparatus and reflective characteristics measuring apparatus employing the same (2013-01-01),

11. 8288739 - Method and apparatus for measuring optical property of fluorescent sample (2012-10-16),

12. 8243261 - Optical property measurement apparatus (2012-08-14),

13. 8195261 - Vital information measuring device (2012-06-05),

14. 8144322 - Spectral characteristic measuring apparatus, method for calibrating spectral characteristic measuring apparatus, and spectral characteristic measuring system (2012-03-27),

15. 8130371 - Method of calibrating reflection characteristic measuring apparatus for sheet specimen (2012-03-06),

Company Overview

Konica Minolta Sensing, Inc., based in Osaka, Japan, specializes in advanced optical measurement technologies. The company focuses on developing solutions in spectral analysis, colorimetry, and 3D shape measurement, catering to diverse industries that require precise measurement and analysis. Their expertise extends to vital information and biometric data systems, as well as calibration systems and pulse wave analysis, positioning them as a leader in the field of optical measurement and related technologies.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

72 Patents

#151 in Osaka

#1,393 in Japan

#10,400 in the World

Konica Minolta Sensing, Inc.

Forward Citations = 478

57 inventors:

Kenji Imura (29 out of 43 patents)

Yoshihisa Abe (9 out of 21 patents)

Yoshiroh Nagai (8 out of 25 patents)

4. Kazumi Kitajima (7 out of 7 patents)

5. Shinichi Horita (6 out of 13 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Konica Minolta Sensing, Inc.. Retrieved from https://idiyas.com/company/konica-minolta-sensing

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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