The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Mar. 18, 2009
Kenji Imura, Toyohashi, JP;
Kenji Imura, Toyohashi, JP;
Konica Minolta Sensing, Inc., Osaka, JP;
Abstract
An optical property measuring method and an optical property measuring apparatus according to an aspect of the invention are operable to select bi-spectral characteristics relatively close to bi-spectral characteristics of a fluorescent sample, out of multiple bi-spectral characteristics stored in advance, based on a relative ratio between excitation efficiencies of the fluorescent sample illuminated by excitation illuminations whose spectral distributions are different from each other, in calculating an optical property of the fluorescent sample. The inventive optical property measuring method and optical property measuring apparatus are advantageous in calculating an optical property of a fluorescent sample easily and with high precision.