Company Filing History:

29 out of 72

Konica Minolta Sensing, Inc.

patents

12 out of 2,816

Minolta Company, Ltd.

Years Active: 1995-2022

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43 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 11428631 - Method for measuring spectral radiation characteristics of fluorescence whitened sample, and device for measuring spectral radiation characteristics of fluorescence whitened sample (2022-08-30),

2. 8767206 - Spectral characteristic measuring device, method for correcting spectral characteristic measuring device, and non-transitory computer readable recording medium (2014-07-01),

3. 8502980 - Spectral characteristic measuring system, spectral characteristic measuring instrument, and data processing device (2013-08-06),

4. 8345230 - Illumination apparatus and reflective characteristics measuring apparatus employing the same (2013-01-01),

5. 8288739 - Method and apparatus for measuring optical property of fluorescent sample (2012-10-16),

6. 8243261 - Optical property measurement apparatus (2012-08-14),

7. 8130371 - Method of calibrating reflection characteristic measuring apparatus for sheet specimen (2012-03-06),

8. 8115924 - Optical characteristic measuring apparatus (2012-02-14),

9. 8064133 - Light receiving optical system, and spectrophotometer incorporated with the same (2011-11-22),

10. 7973935 - Reflection characteristic measuring apparatus for sheet specimen and method of calibrating reflection characteristic measuring apparatus for sheet specimen (2011-07-05),

11. 7916292 - Concave diffraction grating device, reflective dispersion device, and spectral device (2011-03-29),

12. 7859663 - Polychrometer and method for correcting stray lights of the same (2010-12-28),

13. 7852481 - Apparatus and method for measuring optical property (2010-12-14),

14. 7719687 - Apparatus for measuring reflection characteristics of object surfaces (2010-05-18),

15. 7710559 - Calibration reference light source and calibration system using the same (2010-05-04),

Title: **Kenji Imura: Innovator in Spectral Radiation Measurement**

Introduction

Kenji Imura, a renowned inventor based in Toyohashi, Japan, has made significant contributions to the field of spectral radiation measurement. With a remarkable portfolio of 43 patents, his work primarily focuses on the development of advanced methods and devices for assessing the spectral characteristics of fluorescence whitened samples.

Latest Patents

Among his latest patents, Imura has developed two notable innovations: a method for measuring spectral radiation characteristics of fluorescence whitened samples and a device designed for the same purpose. These inventions provide a systematic approach to approximate the fluorescence spectral emissivity coefficient using a variety of excitation lights. The methodology involves sequential illumination and the linear combination of spectral power distributions, enabling precise measurements critical for various scientific applications.

Career Highlights

Imura has an extensive career in the optical measurement industry, having worked with prominent companies such as Konica Minolta Sensing, Inc. and Minolta Company, Ltd. His expertise in spectral measurement technologies has positioned him as a key figure in the development of innovative solutions for complex optical challenges.

Collaborations

Throughout his career, Imura has collaborated with distinguished colleagues such as Masayuki Makino and Yoshiyuki Nagashima. These partnerships have facilitated significant advancements in the field, blending insights and expertise to enhance research outcomes.

Conclusion

Kenji Imura stands out as a prominent inventor whose work continues to influence the realms of optics and fluorescence measurement. His inventive spirit and dedication to innovation are evident in his numerous patents, contributing to the advancement of technology in spectral analysis.

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