The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
May. 23, 2007
Jun Matsumoto, Yokohama, JP;
Kenji Imura, Toyohashi, JP;
Yoshihiro Okui, Daito, JP;
Konica Minolta Sensing, Inc., Sakai-shi, JP;
Abstract
A reflection characteristic measuring apparatus for measuring a characteristic, such as a gloss, of a sample surface. The apparatus includes at least one illuminator for illuminating a sample surface to be measured with light and a plurality of light receiving sections which are arranged axially symmetrically to each other with respect to a normal to an intended object surface and which output two-dimensional light receiving data. A deriving section derives a characteristic of the sample surface such as gloss based on a weighted average obtained by applying a weighting factor to each of the light receiving data outputted from the light receiving sections.