The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Oct. 07, 2009
Takeshi Matsumoto, Toyonaka, JP;
Shinji Yamamoto, Sakai, JP;
Kenji Imura, Toyohashi, JP;
Kazuya Kiyoi, Tondabayashi, JP;
Yoshiyuki Nagashima, Sakai, JP;
Yasushi Goto, Sakai, JP;
Takeshi Matsumoto, Toyonaka, JP;
Shinji Yamamoto, Sakai, JP;
Kenji Imura, Toyohashi, JP;
Kazuya Kiyoi, Tondabayashi, JP;
Yoshiyuki Nagashima, Sakai, JP;
Yasushi Goto, Sakai, JP;
Konica Minolta Sensing, Inc., Osaka, JP;
Abstract
An optical property measurement apparatus includes: a main body which includes a plane-shape surface that is so disposed as to face the display portion; an optical sensor which receives light directed from an opening that is formed through the plane-shape surface; and a support portion which is disposed on a side of the plane-shape surface and keeps a constant distance between the display portion and the plane-shape surface; wherein a light shield portion that is so disposed as to enclose a circumferential area of the opening of the plane-shape surface and shields entrance of light from a region other than a measurement target region of the display portion when the optical property is measured.