The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2013
Filed:
Mar. 16, 2009
Kenji Imura, Toyohashi, JP;
Kenji Imura, Toyohashi, JP;
Konica Minolta Sensing, Inc, Osaka, JP;
Abstract
A spectral characteristic measuring system includes, a data processing apparatus, and a program, which correct an illumination light variation caused by a temperature rise in a semiconductor light-emitting element due to light emission or in a scanning type color measurement system, which sequentially measures color samplesn and in which a semiconductor light-emitting element is used as a light source. Spectral distributions of illumination lights which are measured before and after the color sample is measured are interpolated, to estimate a spectral distribution of an illumination light at the time when a spectral distribution of the color sample is obtained. Spectral characteristics of the color sample are identified based on the spectral distribution of the reflected light or the transmitted light reflected by or transmitted through the color sample and the estimated spectral distribution.