The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2013

Filed:

Nov. 23, 2010
Applicants:

Shinichi Iida, Sakai, JP;

Wataru Yamaguchi, Sakai, JP;

Inventors:

Shinichi Iida, Sakai, JP;

Wataru Yamaguchi, Sakai, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/10 (2006.01); G01J 3/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

A calibration deviceaccording to the present invention is a member used for white calibration of an optical characteristic measuring apparatusfor measuring an optical characteristic of a specimen arranged to close a measuring opening and is used together with a spacer. Accordingly, such a calibration devicecan perform more accurate white calibration by preventing formation of an interference pattern by the spacer


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