The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2004
Filed:
Apr. 24, 2002
Tadashi Fukumoto, Ibaraki, JP;
Shigeru Osaki, Yamatokouriyama, JP;
Masahiro Ariizumi, Osaka, JP;
Norio Matsunaga, Takaishi, JP;
Yoshihisa Abe, Sakai, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
An object of the present invention is to provide a method for accurately measuring a three-dimensional shape of a measuring subject independent of the surface shape of the measuring subject, and another object thereof is to shorten the time from the measurements of the measuring subject until three-dimensional shape data is obtained so as to carry out efficient measuring operations. In a three-dimensional measuring system that measures a three-dimensional shape of a measuring subject, two three-dimensional measuring devices are placed. The three-dimensional measuring device measures a measuring subject placed in a measuring space by allowing a laser slit light L in a longitudinal direction to scan in a lateral direction. Moreover, the three-dimensional measuring device measures the measuring subject placed in a measuring space by allowing the laser slit light L in a lateral direction to scan in a longitudinal direction.