The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2000
Filed:
Nov. 13, 1996
Akira Yahashi, Kobe, JP;
Toshio Norita, Osaka, JP;
Eiro Fujii, Takatsuki, JP;
Fumiya Yagi, Toyonaka, JP;
Satoru Hirose, Kyoto, JP;
Takuto Joko, Kyoto, JP;
Makoto Miyazaki, Ibaraki, JP;
Tadashi Fukumoto, Ibaraki, JP;
Hideki Tanabe, Ibaraki, JP;
Yoshiko Sakagawa, Ibaraki, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
This invention is related to a three-dimensional measuring device for measuring three-dimensional positions of an objects. The three-dimensional measuring device comprises an optical projection system and an optical reception system. In a preliminary measurement prior to an actual measurement, the optical projection system projects slit light beam on the object with varying projection angle with in a narrow range, and the optical reception system receives the slit light beam reflected by the object and generates image signals corresponding to an amount of the received light synchronously with variation of the projection angle. Measurement conditions including intensity of the light beam and the projection angle for the actual measurement are set in accordance with the image signals of the actual measurement. Under the measurement conditions, the actual measurement is executed by projecting the light beam on the object with varying the projection angle within a wide range.