This inventor holds 6 USPTO granted patents. Top assignee: Minolta Company, Ltd.. Active years: 1998-2004.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Takuto Joko. Retrieved from https://idiyas.com/inventor/takuto-joko
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
% Patents Active = 100.0
Average Co-Inventor Count = 3.9
ph-index = 6
Forward Citations = 105(Granted Patents)
Location History:
- Nagaokakyo, JP (1998)
- Nacaokakyo, JP (2000)
- Kyoto, JP (2000 - 2003)
- Toyonaka, JP (2004)
Company Filing History:
Years Active: 1998-2004
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6 patents (USPTO):Explore Patents
2. 6529280 - Three-dimensional measuring device and three-dimensional measuring method (2003-03-04),
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Takuto Joko. Retrieved from https://idiyas.com/inventor/takuto-joko
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
