Company Filing History:
Years Active: 1998-2025
Title: Akira Yahashi: Innovator in Surface Inspection Technology
Introduction
Akira Yahashi is a prominent inventor based in Kobe, Japan. He has made significant contributions to the field of surface inspection technology, holding a total of 9 patents. His work focuses on developing advanced methods and devices for detecting surface defects in various workpieces.
Latest Patents
Yahashi's latest patents include a workpiece surface defect detection device and detection method, as well as a workpiece surface inspection system and program. The defect detection device is designed to stably identify small surface defects with high accuracy. It operates by obtaining multiple images of the workpiece while a bright-and-dark pattern from an illumination device is moved relative to it. A tentative defect candidate is extracted, and if the number of images containing this candidate meets a pre-set threshold, it is confirmed as a defect candidate. The system then combines these images to generate a composite image for defect detection.
Another notable patent is his three-dimensional measuring method and device, along with a corresponding computer program. This innovation aims to accurately reproduce the three-dimensional shape of an object while maintaining high measuring accuracy and speed. The method involves projecting a stripe pattern with colored stripes onto the object and measuring the shape based on the positions of these stripes in the captured images.
Career Highlights
Throughout his career, Akira Yahashi has worked with notable companies such as Minolta Company, Ltd. and Konica Minolta, Inc. His experience in these organizations has contributed to his expertise in imaging and inspection technologies.
Collaborations
Yahashi has collaborated with several talented individuals, including Toshio Norita and Fumiya Yagi, who is a woman. These collaborations have further enriched his work and innovations in the field.
Conclusion
Akira Yahashi's contributions to surface inspection technology and three-dimensional measurement methods highlight his innovative spirit and dedication to advancing the field. His patents reflect a commitment to improving accuracy and efficiency in defect detection, making a significant impact on various industries.