The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2005

Filed:

Aug. 01, 2002
Applicants:

Akira Yahashi, Kobe, JP;

Tetsuya Katagiri, Kyoto, JP;

Fumiya Yagi, Toyonaka, JP;

Hiroshi Uchino, Kyoto, JP;

Yuzuru Tanaka, Ibaraki, JP;

Inventors:

Akira Yahashi, Kobe, JP;

Tetsuya Katagiri, Kyoto, JP;

Fumiya Yagi, Toyonaka, JP;

Hiroshi Uchino, Kyoto, JP;

Yuzuru Tanaka, Ibaraki, JP;

Assignee:

Minolta Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B011/24 ; G06K009/00 ;
U.S. Cl.
CPC ...
Abstract

In order to reproduce a three-dimensional shape of an object accurately while maintaining measuring accuracy and high speed, in a three-dimensional measuring method of projecting a stripe pattern having colored stripes on the object and measuring the three-dimensional shape of the object based on stripe positions on the imaged image corresponding to the stripes on the stripe pattern, colors of the stripes on the stripe pattern are set according to a predetermined rule, and a plurality of stripes having a predetermined positional relationship are extracted from the image, and correspondence with stripes on the stripe pattern based on the color arrangement of the extracted plural stripes.


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