Minolta Company, Ltd.

Konica Minolta, Inc.

Akira Yahashi

Toshio Norita

Fumiya Yagi

Makoto Miyazaki

Takuto Joko

Tadashi Fukumoto

Eiro Fujii

Satoru Hirose

Hideki Tanabe

Yoshiko Sakagawa

Ryuichi Yoshida

Yoshihito Souma

Tetsuya Katagiri

Hiroshi Uchino

Taizo Wakimura

Yuzuru Tanaka

Shota Ueki

A workpiece surface defect detection device or the like that is capable of stably detecting a small surface defect with high accuracy is provided. A plurality of images indicating a portion to be measured of a workpiece serving as a target of detection of a surface defect is obtained in a state where a bright-and-dark pattern of an illumination device is moved relative to the workpiece, and a tentative defect candidate is extracted. When among a plurality of images from which the tentative defect candidate has been extracted, the number of images including the tentative defect candidate is greater than or equal to a threshold that has been set in advance, the tentative defect candidate is determined as a defect candidate. A plurality of images including the determined defect candidate is combined to generate a composite image, and a defect is detected on the basis of the generated composite image.

Workpiece surface defect detection device and detection method, workpiece surface inspection system, and program

In order to reproduce a three-dimensional shape of an object accurately while maintaining measuring accuracy and high speed, in a three-dimensional measuring method of projecting a stripe pattern having colored stripes on the object and measuring the three-dimensional shape of the object based on stripe positions on the imaged image corresponding to the stripes on the stripe pattern, colors of the stripes on the stripe pattern are set according to a predetermined rule, and a plurality of stripes having a predetermined positional relationship are extracted from the image, and correspondence with stripes on the stripe pattern based on the color arrangement of the extracted plural stripes.

Three-dimensional measuring method and device, and computer program

A three-dimensional measuring method comprising the following steps of: carrying out plural-time measurements with respect to a point on an object along the same line of vision using a three-dimensional measuring device; acquiring distance information on a distance between the point on the object and the three-dimensional measuring device for each measurement; determining a difference of the distance information of each point; making a decision such that the measurement is successful when the difference is smaller than a predetermined value; and making a decision such that the measurement is unsuccessful when the difference is larger than the predetermined value.

Three-dimensional measuring method and system

Apparatus for obtaining three-dimensional shape data of an object including a controller for controlling a light beam, a scanning system for scanning an object by the controlled light beam, and an image receiving system for receiving the light reflected from the object in a prescribed range. A memory stores data for correction of illumination irregularities corresponding to positions in the prescribed range that the light reflected from the object is received, and the controller refers to the stored data according to the position where the reflected light is received by the image receiving system, in order to control the light beam used by the scanning system.

Measuring apparatus and measuring method

This invention is related to a three-dimensional measuring device for measuring three-dimensional positions of an objects. The three-dimensional measuring device comprises an optical projection system and an optical reception system. In a preliminary measurement prior to an actual measurement, the optical projection system projects slit light beam on the object with varying projection angle with in a narrow range, and the optical reception system receives the slit light beam reflected by the object and generates image signals corresponding to an amount of the received light synchronously with variation of the projection angle. Measurement conditions including intensity of the light beam and the projection angle for the actual measurement are set in accordance with the image signals of the actual measurement. Under the measurement conditions, the actual measurement is executed by projection the light beam on the object with varying the projection angle within a wide range.

Three-dimensional measuring device and three-dimensional measuring method

A three-dimensional information measuring apparatus is provided, which uses a distance measuring sensor provided externally to an imaging lens. The apparatus enables three-dimensional data input of a small object and makes the influence of a misregistration between the imaging lens and a distance measuring sensor uniform. The apparatus includes a light irradiation device for irradiating a reference light beam to the object, a light reception device for receiving the reference light beam reflected by the object, so as to generate data that determine the position of the object. The apparatus also includes a distance measuring sensor for measuring the distance to the object and a lens controller for adjusting the focal point of an imaging lens in accordance with the output of the distance measuring sensor. The distance measuring sensor is arranged so that the measurement axis crosses the light reception axis of the imaging lens within the measurable distance range.

Three-dimensional information measuring apparatus

The purpose of the three-dimensional measurement method and device is to reduce occlusion while ensuring a predetermined resolution, and increase resolution without increasing occlusion. In a three-dimensional input device provided with a projection device for projecting a reference light U from an starting point A toward an object Q, and an image sensing device for receiving the reference light reflected by the object Q at a position B separated from the starting point A in the baseline direction, and the object Q illuminated by the reference light U is sensed and data specifying the position of the object are output, an anamorphic lens,is provided for forming an image having a magnification in the baseline direction larger than the magnification in a direction perpendicular to the baseline direction on the photoreceptive surface S,of an opto-electric conversion device.

Three-dimensional measurement method and three-dimensional measurement device

This invention is related to a three-dimensional measuring device for measuring three-dimensional positions of an objects. The three-dimensional measuring device comprises an optical projection system and an optical reception system. In a preliminary measurement prior to an actual measurement, the optical projection system projects slit light beam on the object with varying projection angle with in a narrow range, and the optical reception system receives the slit light beam reflected by the object and generates image signals corresponding to an amount of the received light synchronously with variation of the projection angle. Measurement conditions including intensity of the light beam and the projection angle for the actual measurement are set in accordance with the image signals of the actual measurement. Under the measurement conditions, the actual measurement is executed by projecting the light beam on the object with varying the projection angle within a wide range.

A distance measuring apparatus of an apparatus having a moving mechanism includes: a speed detector; and a mechanism responsive to a moving speed signal supplied from the speed detector which varies a focus lens position and a focal length of a light receiving optical system, a scanning range of a light projecting optical system, a base length, a position where light axes of a pair of light receiving optical systems or light axes of the light receiving and light projecting optical systems cross with each other, or responsive to a moving direction signal supplied from a moving direction detecting means of the apparatus having the moving mechanism which changes a measurement direction of a field of view. Thus, optimal measurement accuracy and a field of view to be measured can always be provided even though the moving speed or the moving direction of the apparatus having the moving mechanism is varied.

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Kobe, Japan

Akira Yahashi