The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2005
Filed:
Jan. 31, 2002
Akira Yahashi, Kobe, JP;
Akira Yahashi, Kobe, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
A three-dimensional measuring method comprising the following steps of: carrying out plural-time measurements with respect to a point on an object along the same line of vision using a three-dimensional measuring device; acquiring distance information on a distance between the point on the object and the three-dimensional measuring device for each measurement; determining a difference of the distance information of each point; making a decision such that the measurement is successful when the difference is smaller than a predetermined value; and making a decision such that the measurement is unsuccessful when the difference is larger than the predetermined value.