The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2001
Filed:
Apr. 05, 2000
Akira Yahashi, Kobe, JP;
Toshio Norita, Osaka, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
The purpose of the three-dimensional measurement method and device is to reduce occlusion while ensuring a predetermined resolution, and increase resolution without increasing occlusion. In a three-dimensional input device provided with a projection device for projecting a reference light U from an starting point A toward an object Q, and an image sensing device for receiving the reference light reflected by the object Q at a position B separated from the starting point A in the baseline direction, and the object Q illuminated by the reference light U is sensed and data specifying the position of the object are output, an anamorphic lens,is provided for forming an image having a magnification in the baseline direction larger than the magnification in a direction perpendicular to the baseline direction on the photoreceptive surface S,of an opto-electric conversion device.