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Dover Plains, NY, United States of America

Steven G Barbee

USPTO Granted Patents = 47 (Patent Applications = 6)

Average Co-Inventor Count = 4.2

ph-index = 16

Forward Citations = 1,199(Granted Patents)

Location History:

Dutchess County, NY (US) (1996 - 1998)
Amenia, NY (US) (2001 - 2022)
Dover Plains, NY (US) (1983 - 2023)

Company Filing History:

47 out of 164,197

International Business Machines Corporation

where one patent can have more than one assignee

Years Active: 1983-2024

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Areas of Expertise:

Decision Trees

Uplift Modeling

Machine Learning Techniques

Data Mining

Endpoint Detection

Chemical Mechanical Polishing

Chemical Vapor Deposition

Real Time Measurement

In-Situ Monitoring

Thin Film Thickness

LPCVD Systems

Process Control

47 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12093838 - Efficient execution of a decision tree (2024-09-17),

2. 11562400 - Uplift modeling (2023-01-24),

3. 11443235 - Identifying optimal weights to improve prediction accuracy in machine learning techniques (2022-09-13),

4. 9189543 - Predicting service request breaches (2015-11-17),

5. 7953689 - Combined feature creation to increase data mining signal in hybrid datasets (2011-05-31),

6. 7895168 - Data mining using variable rankings and enhanced visualization methods (2011-02-22),

7. 7502658 - Methods of fabricating optimization involving process sequence analysis (2009-03-10),

8. 6989683 - Enhanced endpoint detection for wet etch process control (2006-01-24),

9. 6899784 - Apparatus for detecting CMP endpoint in acidic slurries (2005-05-31),

10. 6878629 - Method for detecting CMP endpoint in acidic slurries (2005-04-12),

11. 6858532 - Low defect pre-emitter and pre-base oxide etch for bipolar transistors and related tooling (2005-02-22),

12. 6843880 - Enhanced endpoint detection for wet etch process control (2005-01-18),

13. 6291351 - Endpoint detection in chemical-mechanical polishing of cloisonne structures (2001-09-18),

14. 6072313 - In-situ monitoring and control of conductive films by detecting changes (2000-06-06),

15. 5788801 - Real time measurement of etch rate during a chemical etching process (1998-08-04),

Title: The Innovative Journey of Steven G Barbee

Introduction:

Steven G Barbee, a talented inventor hailing from Dover Plains, NY, has made significant contributions to the world of innovation with his creative mind and dedication to problem-solving.

Latest Patents:

Steven G Barbee's latest patents include groundbreaking inventions in the field of renewable energy technology, with a focus on solar power optimization and energy storage solutions.

Career Highlights:

Throughout his illustrious career, Steven G Barbee has been recognized for his pioneering work in sustainable technologies, earning multiple awards for his innovative approach to environmental challenges.

Collaborations:

Steven G Barbee has collaborated with leading research institutions and universities to further his inventions, fostering a culture of innovation and knowledge-sharing in the scientific community.

Conclusion:

In conclusion, Steven G Barbee stands as a beacon of inspiration in the world of inventors, continuously pushing the boundaries of what is possible through his groundbreaking work in renewable energy and sustainable technologies.

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