The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2011

Filed:

Jan. 09, 2008
Applicants:

Steven G. Barbee, Amenia, NY (US);

Benjamin R. Chu, Austin, TX (US);

John W. Hopkins, Williston, VT (US);

Inventors:

Steven G. Barbee, Amenia, NY (US);

Benjamin R. Chu, Austin, TX (US);

John W. Hopkins, Williston, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Dimensional data with attributed categorical variables is mined against a continuous target with any data mining method by ranking variables. The ranked variables are used to generate a tree. A population and a target value, obtained from a top node of the tree, are stored. The top node is removed from the tree to create a new tree with a next top node. Obtaining and storing a next population and a next target value for the next top node, and removing the top node or top field to create a new tree, are repeated. The listing of sequential top node parameters is plotted on a tree cusp curve that provides a graphical user interface enabling identification of a field which affect a greatest or a least number of records, based upon a magnitude of departure of the field from a norm.


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