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For the Inventor, By the Inventor

Hopewell Junction, NY, United States of America

Steven B Herschbein

USPTO Granted Patents = 12 

Average Co-Inventor Count = 3.8

ph-index = 5

Forward Citations = 65(Granted Patents)


Company Filing History:

goldMedal12 out of 164,108 
 
International Business Machines Corporation
 patents

Years Active: 2003-2012

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12 patents (USPTO):
1. 8111903 - Inline low-damage automated failure analysis (2012-02-07),
2. 7867910 - Method of accessing semiconductor circuits from the backside using ion-beam and gas-etch (2011-01-11),
3. 7781733 - In-situ high-resolution light-optical channel for optical viewing and surface processing in parallel with charged particle (FIB and SEM) techniques (2010-08-24),
4. 7351966 - High-resolution optical channel for non-destructive navigation and processing of integrated circuits (2008-04-01),
5. 7119333 - Ion detector for ion beam applications (2006-10-10),
6. 6987067 - Semiconductor copper line cutting method (2006-01-17),
7. 6946064 - Sample mount for performing sputter-deposition in a focused ion beam (FIB) tool (2005-09-20),
8. 6900137 - Dry etch process to edit copper lines (2005-05-31),
9. 6858530 - Method for electrically characterizing charge sensitive semiconductor devices (2005-02-22),
10. 6843893 - Metal dry etch using electronic field (2005-01-18),
11. 6730237 - Focused ion beam process for removal of copper (2004-05-04),
12. 6670717 - Structure and method for charge sensitive electrical devices (2003-12-30),

Title: Innovations of Steven B Herschbein

Introduction

Steven B Herschbein is a prominent inventor based in Hopewell Junction, NY (US). He has made significant contributions to the field of semiconductor technology, holding a total of 12 patents. His work focuses on improving the efficiency and effectiveness of semiconductor device processing.

Latest Patents

Herschbein's latest patents include innovative systems and methods that enhance failure analysis and access to semiconductor circuits. One of his notable inventions is the "Inline low-damage automated failure analysis," which utilizes an inline focused ion beam milling tool for milling and capturing images of cross sections at desired inspection points. This automation significantly reduces the time required for inspections by employing a computer vision system to identify fiducials corresponding to X-Y offsets. Another important patent is the "Method of accessing semiconductor circuits from the backside using ion-beam and gas-etch." This method involves creating a pocket in a material to be etched and performing an isotropic etch by directing a focused ion beam into the pocket while flowing a reactive gas.

Career Highlights

Herschbein is currently employed at International Business Machines Corporation (IBM), where he continues to develop cutting-edge technologies in semiconductor processing. His extensive experience and innovative mindset have positioned him as a key player in the industry.

Collaborations

Throughout his career, Herschbein has collaborated with talented individuals such as Chad Rue and Michael Ray Sievers. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Steven B Herschbein's contributions to semiconductor technology through his patents and collaborations highlight his role as an influential inventor. His work continues to shape the future of the industry, making significant strides in efficiency and effectiveness.

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