The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2006

Filed:

Nov. 10, 2004
Applicants:

Steven B. Herschbein, Hopewell Junction, NY (US);

Narender Rana, Albany, NY (US);

Chad Rue, Poughkeepsie, NY (US);

Michael R. Sievers, Poughkeepsie, NY (US);

Inventors:

Steven B. Herschbein, Hopewell Junction, NY (US);

Narender Rana, Albany, NY (US);

Chad Rue, Poughkeepsie, NY (US);

Michael R. Sievers, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/225 (2006.01); H01J 37/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Detection of weak ion currents scattered from a sample by an ion beam is improved by the use of a multiplier system in which a conversion electrode converts incident ions to a number of secondary electrons multiplied by a multiplication factor, the secondary electrons being attracted to an electron detector by an appropriate bias. In one version, the detector is a two stage system, in which the secondary electrons strike a scintillator that emits photons that are detected in a photon detector such as a photomultiplier or a CCD.


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