Location History:
- Albany, NY (US) (2006 - 2010)
- Highland, NY (US) (2011 - 2016)
Company Filing History:
5 out of 164,108 
2 out of 5,671 
Years Active: 2006-2016
Title: Narender N Rana: Innovator in Semiconductor Metrology
Introduction
Narender N Rana is a prominent inventor based in Highland, NY (US). He has made significant contributions to the field of semiconductor device fabrication, holding a total of 6 patents. His work focuses on enhancing the accuracy and efficiency of semiconductor manufacturing processes.
Latest Patents
One of his latest patents is titled "Automated hybrid metrology for semiconductor device fabrication." This patent describes methods and systems for fabricating and measuring features of a semiconductor device structure. An exemplary method involves fabricating a feature on a wafer of semiconductor material, determining a hybrid recipe for measurement, configuring multiple metrology tools, and obtaining a hybrid measurement in accordance with the recipe.
Another notable patent is "System and method for estimating spatial characteristics of integrated circuits." This method includes calculating a correlation between a dimension of a photoresist layer and exposure to a scanning electron microscope (SEM) for at least one reference integrated circuit pattern. The correlation provides a relationship between the dimension of the photoresist and the spatial characteristic, allowing for accurate estimations of target integrated circuits.
Career Highlights
Narender has worked with leading companies in the semiconductor industry, including IBM and Globalfoundries Inc. His experience in these organizations has allowed him to develop innovative solutions that address complex challenges in semiconductor manufacturing.
Collaborations
Throughout his career, Narender has collaborated with notable professionals in the field, including Steven B Herschbein and Chad Rue. These collaborations have contributed to the advancement of semiconductor technologies and methodologies.
Conclusion
Narender N Rana is a distinguished inventor whose work in semiconductor metrology has led to significant advancements in the industry. His innovative patents and collaborations reflect his commitment to improving semiconductor device fabrication processes.
Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.