Fremont, CA, United States of America

Stephanie Chen


Average Co-Inventor Count = 4.9

ph-index = 4

Forward Citations = 107(Granted Patents)


Company Filing History:


Years Active: 2011-2017

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7 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Stephanie Chen

Introduction

Stephanie Chen is a prominent inventor based in Fremont, CA, known for her significant contributions to the field of wafer inspection technology. With a total of 7 patents to her name, she has developed innovative methods that enhance the efficiency and accuracy of defect detection in semiconductor manufacturing.

Latest Patents

Among her latest patents, one notable invention is the "Context-based inspection for dark field inspection." This patent outlines methods and systems for detecting defects on a wafer. The process involves altering design clips based on their expected appearance in the output generated by a wafer inspection process. Additionally, it includes aligning these altered design clips to the output during the inspection process, ultimately leading to effective defect detection.

Another significant patent is "Segmentation for wafer inspection." This invention provides methods for segmenting pixels in images acquired for wafer inspection. The method determines statistics for individual pixels and assigns them to segments based on these statistics. It also includes detecting edges between segments and generating an edge map, which aids in further segmenting the image for accurate defect detection.

Career Highlights

Stephanie has worked with notable companies in the industry, including Kla Tencor Corporation and Kla-Tencor Technologies Corporation. Her experience in these organizations has allowed her to refine her skills and contribute to advancements in wafer inspection technologies.

Collaborations

Throughout her career, Stephanie has collaborated with talented individuals such as Yong Zhang and Tao Luo. These collaborations have fostered innovation and have been instrumental in the development of her patented technologies.

Conclusion

Stephanie Chen's work in wafer inspection technology exemplifies her commitment to innovation and excellence. Her patents not only reflect her expertise but also contribute significantly to the advancement of the semiconductor industry.

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