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For the Inventor, By the Inventor

Hiroshima, Japan

Shuji Yamaoka

This inventor holds 23 USPTO granted patents, primarily in Circuit Board Inspection. Top assignees: Oht Inc., Sumitomo Wiring Systems, Limited, Varian Medical Systems, Inc.. Active years: 2003-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shuji Yamaoka. Retrieved from https://idiyas.com/inventor/shuji-yamaoka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 23

% Patents Active = 8.7

Average Co-Inventor Count = 2.1

ph-index = 5

Forward Citations = 176(Granted Patents)


Location History:

  • Hiroshima, JP (2003 - 2007)
  • Fukuyama, JP (2004 - 2009)

Company Filing History:

goldMedal22 out of 31 
 
Oht Inc.
 patents
silverMedal1 out of 6,425 
 
Sumitomo Wiring Systems, Limited
 patents
bronzeMedal1 out of 742 
 
Varian Medical Systems, Inc.
 patents
where one patent can have more than one assignee

Years Active: 2003-2009

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Areas of Expertise:
Wire Harness Checker
Conductor Inspection
Electronic Circuit Inspection
Sensor Probe
Active RC Circuit
Pattern Inspection
Continuity Test
Inspection Apparatus
Inspection Method
Substrate Displacement Detection
Electrostatic Imager
23 patents (USPTO):Explore Patents
1. 7495452 - Wire harness checker and wire harness checking method (2009-02-24),
2. 7332914 - Conductor inspection apparatus and conductor inspection method (2008-02-19),
3. 7239127 - Apparatus and method for inspecting electronic circuits (2007-07-03),
4. 7173445 - Sensor for inspection instrument and inspection instrument (2007-02-06),
5. 7138805 - Device and method for inspection (2006-11-21),
6. 7088107 - Circuit pattern inspection instrument and pattern inspection method (2006-08-08),
7. 7026870 - Low-noise active RC signal processing circuit (2006-04-11),
8. 6995566 - Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium (2006-02-07),
9. 6992493 - Device and method for substrate displacement detection (2006-01-31),
10. 6972573 - Device and method for inspecting circuit board (2005-12-06),
11. 6967498 - Apparatus and method for inspecting electronic circuits (2005-11-22),
12. 6958619 - Inspecting apparatus and inspecting method for circuit board (2005-10-25),
13. 6952104 - Inspection method and apparatus for testing fine pitch traces (2005-10-04),
14. 6947853 - Apparatus and method for inspecting electrical continuity of circuit board, jig for use therein, and recording medium thereon (2005-09-20),
15. 6943559 - Circuit pattern inspection device, circuit pattern inspection method, and recording medium (2005-09-13),

Title: The Innovative Journey of Shuji Yamaoka

Introduction: Shuji Yamaoka, a pioneering inventor hailing from Hiroshima, Japan, has made significant contributions to the field of technology with his groundbreaking innovations.

Latest Patents: Shuji Yamaoka holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: Throughout his illustrious career, Shuji Yamaoka has worked with leading tech companies and research institutions, spearheading projects that have revolutionized various industries. His dedication to pushing the boundaries of what is possible has earned him a reputation as a visionary in the world of innovation.

Collaborations: Shuji Yamaoka has collaborated with top engineers, scientists, and designers from around the globe, fostering a culture of creativity and excellence in all his projects. His ability to work seamlessly in interdisciplinary teams has led to the development of cutting-edge solutions that have had a lasting impact on society.

Conclusion: Shuji Yamaoka's relentless pursuit of innovation and his passion for creating a better future through technology continue to inspire generations of inventors and entrepreneurs worldwide. His legacy serves as a testament to the power of imagination and ingenuity in shaping a brighter tomorrow.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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