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Hiroshima, Japan

Oht Inc.

Calculating rank

USPTO Granted Patents = 31

% Expired Patents = 80.6

Forward Citations = 208

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24 inventors (with patents filed for the assignee):

Shuji Yamaoka (22 out of 23 patents)

Shogo Ishioka (18 out of 18 patents)

Yuji Odan (4 out of 4 patents)

4. Tatuhisa Fujii (4 out of 4 patents)

5. Akira Nurioka (3 out of 3 patents)

6. Rihito Kuroda (2 out of 23 patents)

7. Shigetoshi Sugawa (2 out of 175 patents)

8. Tetsuya Goto (2 out of 29 patents)

9. Mishio Hayashi (2 out of 20 patents)

10. Koji Okano (2 out of 2 patents)

11. Hiroshi Hamori (2 out of 2 patents)

12. Toshiro Yasuda (2 out of 2 patents)

13. Yoshikazu Taniguchi (1 out of 13 patents)

14. Hideo Onishi (1 out of 2 patents)

15. Masataka Nakamura (1 out of 2 patents)

Core Competencies:

Capacitive Sensor

Circuit Board

Inspection Method

Electronic Circuit

Pattern Inspection

Low-Noise Circuit

Conductor Inspection

Substrate Detection

Continuity Test

Inspection Device

Sensor Probe

Conductive Patterns

31 patents: Sort by Forward Citations

1. 11662328 - Capacitive sensor and manufacturing method of capacitive sensor (2023-05-30),

2. 11567114 - Capacitance detection area sensor and conductive pattern sensing apparatus having capacitance detection area sensor (2023-01-31),

3. 7495452 - Wire harness checker and wire harness checking method (2009-02-24),

4. 7332914 - Conductor inspection apparatus and conductor inspection method (2008-02-19),

5. 7239127 - Apparatus and method for inspecting electronic circuits (2007-07-03),

6. 7173445 - Sensor for inspection instrument and inspection instrument (2007-02-06),

7. 7138805 - Device and method for inspection (2006-11-21),

8. 7088107 - Circuit pattern inspection instrument and pattern inspection method (2006-08-08),

9. 7049826 - Inspection device and inspection method (2006-05-23),

10. 7026870 - Low-noise active RC signal processing circuit (2006-04-11),

11. 6995566 - Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium (2006-02-07),

12. 6992493 - Device and method for substrate displacement detection (2006-01-31),

13. 6972573 - Device and method for inspecting circuit board (2005-12-06),

14. 6967498 - Apparatus and method for inspecting electronic circuits (2005-11-22),

15. 6958619 - Inspecting apparatus and inspecting method for circuit board (2005-10-25),

Company Overview

Oht Inc., based in Hiroshima, Japan, specializes in the development and manufacturing of advanced optical and imaging technologies. The company focuses on providing innovative solutions for various industries, including automotive, medical, and consumer electronics. With a commitment to research and development, Oht Inc. aims to enhance visual communication and imaging capabilities through cutting-edge technology. Their expertise in optical systems positions them as a key player in the evolving landscape of imaging solutions.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

31 Patents

#17 in Hiroshima, 729-3431

#2,270 in Japan

#21,284 in the World

Hiroshima, Japan

Oht Inc.

Forward Citations = 208

24 inventors:

Shuji Yamaoka (22 out of 23 patents)

Shogo Ishioka (18 out of 18 patents)

Yuji Odan (4 out of 4 patents)

4. Tatuhisa Fujii (4 out of 4 patents)

5. Akira Nurioka (3 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Oht Inc.. Retrieved from https://idiyas.com/company/oht

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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