Nirasaki, Japan

Shinjiro Watanabe

USPTO Granted Patents = 9 

Average Co-Inventor Count = 1.2

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2007-2025

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9 patents (USPTO):Explore Patents

Title: Innovations of Shinjiro Watanabe

Introduction

Shinjiro Watanabe is a prominent inventor based in Nirasaki, Japan. He has made significant contributions to the field of test apparatus technology, holding a total of 9 patents. His work focuses on improving methods for testing substrates, which is crucial in various technological applications.

Latest Patents

Watanabe's latest patents include a method for setting up a test apparatus and an alignment method for inspection apparatus. The method for setting up a test apparatus involves acquiring images to calculate the position and angle of probes and electrode pads on a substrate. This innovative approach enhances the accuracy and efficiency of testing processes. The alignment method of a probe card includes calculating gradients and centers for multiple probe groups, ensuring precise alignment for effective testing.

Career Highlights

Watanabe has built a successful career at Tokyo Electron Limited, a leading company in the semiconductor industry. His expertise in developing advanced testing methods has positioned him as a key figure in the field. His contributions have not only advanced technology but have also improved the reliability of testing processes in semiconductor manufacturing.

Collaborations

Watanabe has collaborated with notable colleagues such as Michikazu Nakamura and Haruhiko Yoshioka. These partnerships have fostered innovation and have led to the development of cutting-edge technologies in the industry.

Conclusion

Shinjiro Watanabe's work exemplifies the spirit of innovation in the semiconductor field. His patents and contributions continue to influence the industry, showcasing the importance of precise testing methods in technology development.

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