The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
Jul. 03, 2023
Tokyo Electron Limited, Tokyo, JP;
Shinjiro Watanabe, Yamanashi, JP;
Taisei Kondo, Hokkaido, JP;
Tokyo Electron Limited, Tokyo, JP;
Abstract
A testing device includes photographing, segmenting, position determining, and position adjusting units. The photographing unit is configured to photograph a needle tip of a probe needle provided in a probe card used for testing of a test object. The segmenting unit is configured to recognize a needle region and a needle tip region of a validation image photographed by the photographing unit, by inputting the validation image to a segmentation model that is trained as described in the specification. The position determining unit is configured to determine a position of the needle tip based on a positional relationship between the needle region and the needle tip region. The position adjusting unit is configured to adjust a relative position between the test object and the needle tip of the probe needle based on the position of the needle tip determined by the position determining unit.